XPD stack plot for CHA-AEI
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Data details | |
| Patterns calculated by | |
| Hermann Gies | |
| Institut für Geologie, Mineralogie und Geophysik Ruhr-Universität Bochum D-44780 Bochum | |
| Calculation | |
| Program used: DIFFaX by Michael M.J. Treacy | |
| Method: Random stacking of CHA-AEI layers, taking into account the relative percentages of the polymorphs CHA and AEI | |
| Wavelength: 1.5418Å | |